主題：Optimal accelerated life tests under interval censoring with random removals: the case of Weibull failure distribution
主講人：丁昌 博士
時間：2013年10月24日（周四）下午15:00
地點：北院卓遠樓305
主辦單位：統(tǒng)計與數(shù)學(xué)學(xué)院
摘要：In this paper, optimal accelerated life test (ALT) plans are investigated under progressive Type I interval censoring with random removals when lifetimes are Weibull distributed. The optimal ALT plans which minimize the asymptotic variance of the estimated qth quantile for different combinations of total number of inspections and removal probability are presented. For implementation convenience, the practical plans, which adopt the same optimality criterion but the inspection times are determined based on the ideas of equally spaced or equal probability scheme at each stress level, are also derived. Numerical studies are conducted to evaluate the relative efficiency of a practical plan to the corresponding optimal ALT plan. Some suggestions are given to experimenters for selecting an appropriate practical plan in designing an ALT under the proposed censoring scheme.
丁昌博士簡介：
香港城市大學(xué)統(tǒng)計學(xué)博士，副教授,。研究領(lǐng)域為可靠性分析和生物統(tǒng)計,，目前已完成國家自然科學(xué)基金——數(shù)學(xué)天元基金一項，出版專著一部,，發(fā)表SCI論文數(shù)篇,。
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